Katayama Hirofumi MZ b7794e8112 [APITESTS][WIN32KNT_APITEST] Improve NtGdiBitBlt testcase (#1277) ... Use `ok_int`, `ok_long` and `ok` macros instead of obsolete `TEST` and `TESTX` macros.		2019-01-22 20:51:00 +09:00
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NtGdiArcInternal.c	[APITESTS][WIN32KNT_APITEST] Improve NtGdiArcInternal testcase (#1276)	2019-01-21 17:39:05 +01:00
NtGdiBitBlt.c	[APITESTS][WIN32KNT_APITEST] Improve NtGdiBitBlt testcase (#1277)	2019-01-22 20:51:00 +09:00
NtGdiCombineRgn.c	[APITESTS][WIN32KNT_APITEST] Improve NtGdiCombineRgn testcase (#1279)	2019-01-22 20:49:47 +09:00
NtGdiCreateBitmap.c
NtGdiCreateCompatibleBitmap.c
NtGdiCreateCompatibleDC.c
NtGdiCreateDIBSection.c
NtGdiDeleteObjectApp.c
NtGdiDoPalette.c
NtGdiEngCreatePalette.c
NtGdiEnumFontOpen.c
NtGdiExtTextOutW.c
NtGdiFlushUserBatch.c
NtGdiGetBitmapBits.c
NtGdiGetDIBits.c
NtGdiGetFontResourceInfoInternalW.c
NtGdiGetRandomRgn.c
NtGdiGetStockObject.c
NtGdiPolyPolyDraw.c
NtGdiRestoreDC.c
NtGdiSaveDC.c
NtGdiSelectBitmap.c
NtGdiSelectBrush.c
NtGdiSelectFont.c
NtGdiSelectPen.c
NtGdiSetBitmapBits.c
NtGdiSetDIBitsToDeviceInternal.c