[APITESTS][WIN32KNT_APITEST] Improve NtGdiExtTextOutW testcase (#1286)

Use ok_int macros instead of obsolete TEST macros.
This commit is contained in:
Katayama Hirofumi MZ 2019-01-22 21:11:26 +09:00 committed by GitHub
parent 1a591cbdfa
commit 377734c9ec
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@ -43,18 +43,16 @@ START_TEST(NtGdiExtTextOutW)
len = wcslen(lpstr);
ret = NtGdiExtTextOutW(hDC, 0, 0, 0, &rect, lpstr, len, Dx, 0);
TEST(ret == 1);
ok_int(ret, 1);
ret = NtGdiExtTextOutW(hDC, 0, 0, ETO_PDY, &rect, lpstr, len, Dx, 0);
TEST(ret == 1);
ok_int(ret, 1);
/* Test invalid lpDx */
ret = NtGdiExtTextOutW(hDC, 0, 0, 0, 0, lpstr, len, (INT*)((ULONG_PTR)-1), 0);
TEST(ret == 0);
ok_int(ret, 0);
/* Test alignment requirement for lpDx */
ret = NtGdiExtTextOutW(hDC, 0, 0, 0, 0, lpstr, len, (INT*)((ULONG_PTR)Dx + 1), 0);
TEST(ret == 1);
ok_int(ret, 1);
}